Analysis of TFT-LCD Point Defect Detection System Based on Machine Vision
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DOI: 10.25236/csam.2019.077
Author(s)
Zhang Wenqian, Zhang Jinhong
Corresponding Author
Zhang Wenqian
Abstract
This paper mainly gives an introduction to the machine vision-based TFT-LCD point defect detection control system. As the use of otsu algorithm for segmentation is not good enough for TFT-LCD image in the condition of weak contrast ratio of the object and background, it is proposed to improve the threshold and extract function by Wible function, and the optimized otsu algorithm has better segmentation effect than the traditional otsu algorithm in the condition of weak contrast ratio of the object and background. After the testing by transplanting the Matlab image processing program to the hardware platform of TFT-LCD defect detection control system, the experimental results show that the detection control system can quickly and accurately process three types of defects, and the shortest detection time can be shortened to 4.5s.
Keywords
Machine Vision, TFT-LCD, OTSU Algorithm, Defect Detection